To meet the market demand for more efficient and reliable testing solutions, Ketai Optoelectronics recently released the VMP9001.

This testing equipment is an upgrade of the VMP9000, a wafer mass production testing equipment based on narrow-pulse driving specifically designed for VCSEL lidar applications. It incorporates new features such as faster UPH, integrated reverse leakage current testing, greater pulse power, and probe mark detection.

01 Faster UPH

The industry-leading UPH has made the VMP9000 narrow-pulse wafer mass production test bench very suitable for mass production CP testing. Through innovative technology and process optimization, the VMP9001's throughput per hour (UPH) far exceeds that of the VMP9000, more than doubling it to over 2000 units/hour, greatly shortening the test cycle and improving testing efficiency.

02 Integrated Reverse Leakage Current Testing

Reverse leakage current testing can be used to detect the quality of VCSEL devices. High-quality VCSELs should have low leakage current under reverse bias conditions, which helps ensure the stability and reliability of the device. Excessive reverse leakage current may lead to damage or instability of the VCSEL device. Performing reverse leakage current testing before mass production can eliminate defective products and improve product quality.

The VMP9001 integrates reverse leakage current testing with the original tests, allowing users to perform performance testing on the same machine.

It supports reverse voltage testing up to -200V and nA-level accuracy to meet customer testing needs. During the testing process, the presence of abnormal leakage current under reverse bias (reverse voltage) is determined to ensure the stable performance of VCSEL devices under different voltage and narrow pulse conditions, eliminating potential defects and problems before downstream packaging and module integration. 03 Greater Pulse Power Applications such as LiDAR require VCSELs to operate stably at high power. The VMP9001 supports a maximum pulse current output capability of 30A, significantly increasing the test power range and enabling higher output power measurement at the wafer level, helping users to more accurately evaluate the performance of VCSELs. 04 Probe Mark Detection During wafer testing, probe mark problems such as probe mark offset and excessive depth are prone to occur. The VMP9001 has a probe mark detection function, allowing users to determine whether the probe mark area is too large, whether the probe mark position is too close to the chip pad boundary, and whether the probe mark is too deep, thereby improving product yield and reliability and ensuring the reliability of the test equipment. Cotest is constantly moving forward in providing professional test and measurement solutions for our customers. For more information about this product, please contact info@cotest.com.cn. Cotest will also be exhibiting at the 2023 Shenzhen Optoelectronics Expo. If you are interested, please visit booth 6A29. We look forward to seeing you there!