Detector Wafer Probe Station &System C9

Based on the C5 semi-automatic probe station platform,the C9 system is specifically optimized for high-efficiency mass production testing of photodetectors,including PD,APD,and SPAD devices.

Application
Specifications
Download

Based on the C5 semi-automatic probe station platform,the C9 system is specifically optimized for high-efficiency mass production testing of photodetectors,including PD,APD,and SPAD devices.
Two application-tailored configurations are currently in mass production.For detailed specifications, contact Cotest technical support to request product datasheets.