At the 5th Lidar Advanced Technology Exhibition and Exchange Conference held concurrently, Jiang Wei, R&D Director of Ketai Optoelectronics, delivered a keynote speech on "Wafer-Level Testing Methods and Related Technical Background of High-Power VCSEL Lasers." Exhibitors and attendees from all over the country gathered to listen to Mr. Jiang's presentation.

At the event, Jiang Wei first demonstrated the basic parameters of VCSEL basic performance testing to the audience. "Although these parameters seem relatively simple, we are facing more and more challenges on the testing side. To address these challenges, we are continuously introducing newer solutions that better meet the actual needs of our users." "How do you test high-power VCSELs? We started planning for this two years ago and have been continuously innovating, introducing increasingly sophisticated testing capabilities to meet our customers' testing needs." KeTai Optoelectronics' VCSEL wafer-level testing equipment has evolved from the initial 200ns level to the 100ns level, and now, 50ns testing equipment is about to be released. Meanwhile, Jiang Wei stated that for automotive-grade applications, Ketai Optoelectronics is also focusing on reverse leakage current. "We will integrate reverse leakage current testing, supporting reverse voltage testing up to -200V and nA-level accuracy to meet customer testing needs." Ketai Optoelectronics' testing equipment is encountering an increasing number of application scenarios: from single VCSEL chips to 1D multi-channel VCSEL chips, and then to 2D addressable VCSEL chips. Ketai has corresponding solutions for different application scenarios. “We need to support all types of chip testing on a single platform, which is a significant challenge. Although narrow-pulse and wide-pulse testing both require LIV, near-field, and far-field testing, the testing of high-power multi-junction VCSELs, especially multi-dimensional VCSEL chips, presents significant difficulties for wafer-level testing. Fortunately, Kotei Optoelectronics has overcome these challenges,” said Jiang Wei. Jiang Wei highlighted testing solutions for automotive lidar, which aligns with the theme of this conference. In addition to wafer-level testing solutions, Kotei Optoelectronics also offers corresponding testing solutions for packaged devices and modules, with many parameters reaching leading domestic levels.

Beyond the presentations, Ketai Optoelectronics' "High-Speed Optical Power Meter" exhibited at the booth also received high praise and recognition from industry experts and attendees.

This compact device, designed for R&D-level high-power pulsed optical power testing, is suitable for LiDAR and other applications requiring pulsed optical power detection. It can automatically capture pulsed optical waveforms, automatically read the optical power value at each point, and quickly and conveniently collect the peak optical power of VCSEL lasers. Its minimum detection resolution can reach within 1W, and the bandwidth can reach up to 500MHz.

With its excellent testing capabilities and flexible application scenarios, the high-speed optical power meter attracted many customers to stop and inquire at the exhibition.

In the future, Ketai Optoelectronics will continue to uphold its R&D spirit and innovate continuously, providing customers with better solutions and services.