Based on the  C5  semi-automatic  probe  station platform,the C8 system is specifically engineeredfor high-volume  production  testing  of  VCSEL  devices widely   used   in   optical   communications,distance sensing,and 3D sensing applications. 
Developed  through  in-depth  collaborations  with industry leaders and integrating market-driven expertise,the C8 series delivers industry-leading performance for diverse VCSEL wafer testing scenarios.It enables comprehensive characterization under varied driving conditions(DC,μs/ns pulsed modes),covering LIV(Light-Current-Voltage),spectral response,and near-/far-field optical parameters. 
Three application-optimized configurations are currently in mass production.For detailed specifications,contact Cotest technical support to request product datasheets.