DAM9000 is a semiconductor burn-in Test system designed to simulate extreme operating conditions for accelerated aging and latent failure detection.Featuring an 18-chamber configuration,each chamber supports simultaneous aging of 16 devices(total capacity:288 devices)with multi-task parallel processing.
It achieves aging tests with<100ns pulses and up to 30A current drive,accurately emulating semiconductor laser diodes' operational states. Integrated PC-based control and real-time monitoring provide reliable data for performance evaluation, lifetime assessment,and quality control.