Recently, a group standard for "Vertical Cavity Surface Emitting Laser Wafer Testers," spearheaded by Kotech Optoelectronics (Changzhou) Testing Technology Co., Ltd. (hereinafter referred to as "Kotech Optoelectronics") and organized by the National Technical Committee for Standardization of Optics and Photonics, and jointly drafted by multiple organizations, was officially released. This significant achievement marks a step towards standardization in the testing of Vertical Cavity Surface Emitting Lasers (VCSELs).

With the rapid development of technology, VCSELs are being increasingly used in consumer electronics, automotive, and communication fields, such as 3D sensing, facial recognition, and LiDAR. However, technical challenges continuously arise in the R&D and manufacturing processes, and the need for standardized testing is becoming increasingly prominent. Traditional testing methods for communication devices are insufficient, and there is a lack of unified standards for VCSEL wafer testing equipment.

Leveraging its deep technical expertise and extensive practical experience in this field, and in conjunction with relevant national and industry standards, Kotei Optoelectronics actively led the organization of relevant units and experts to develop this group standard through in-depth research and repeated deliberation.

Taking this group standard release as an opportunity, Kotei Optoelectronics will further strengthen cooperation and communication with industry partners, actively promote the application of this standard, and contribute to technological innovation and high-quality development of the industry. At the same time, the company will continue to leverage its strengths and continuously introduce newer solutions that better meet the actual needs of users.